Crack the Hardware Interview

We founded Chipress Academy and wrote this book series to share our knowledge, experiences and perspectives towards hardware interviews.

Our website and the book series cover Architecture, Micro-architecture, Verification, Implementation, Synthesis, Power, Physical Design and Silicon Debug.

  • https://amzn.to/4ipMxgY
  • https://amzn.to/4kGJzWX
  • https://amzn.to/3x2lfL4

Lastest

  • What are LEC abort points? How to debug aborts?

    It is not uncommon to see abort points during LEC. They are the key points that have not been proven either equivalent or non-equivalent based on the current tool settings, such as compare…

  • How to improve re-build time during test case development?

    During test case development, the trial and error process often causes re-compilation and re-elaboration of the entire database, including testbench (TB), DUT, C-model, and sometimes even UPF if it is for power-aware verification.…

  • Semiconductor ATE Testing: Why Every Chip Needs a Test

    I. The Imperative of Testing: Quality, Cost, and Reliability Semiconductor testing is a non-negotiable step in modern manufacturing, driven by quality, reliability, and cost control. The key tool is the Automatic Test Equipment…

Subscribe

Enter your email to get updates from us. You might need to check the spam folder for the confirmation email.

Read Our Books for Free with Kindle Unlimited

Our books are available on Kindle Unlimited for free. Plus, you get unlimited access to hundreds of other books for preparing hardware interviews, including our recommended reading list

* Chipress participates in the Amazon Services LLC Associates Program, an affiliate advertising program designed to provide a means for sites to earn advertising fees by advertising and linking to Amazon.com

https://amzn.to/3yBJqRo

Kindle Reader: Better Reading Experience

Power

Interview questions about ASIC / SoC power analysis methodology and power optimization techniques. Helpful on preparing power interview questions